Fast Statistical Analysis of Rare Failure Events for SRAM Circuits in High - Dimensional
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چکیده
منابع مشابه
ICCAD : G : Fast Statistical Analysis of Rare Circuit Failure Events in High-Dimensional Variation Space
As integrated circuit (IC) technology advances, the ever increasing process variation has become a growing concern [1]. A complex IC, containing numerous circuit components (e.g., millions of SRAM bit-cells integrated in an advanced microprocessor), is required to meet the design specification not only at the nominal process corner, but also under large-scale process variations. To achieve suff...
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